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Hiroyuki Fujiwara

Hiroyuki Fujiwara, Japanese research scientist. Achievements include research in Developments of real-time spectroscopic ellipsometry and infrared attenuated total reflection spectroscopy for monitoring semiconductor thin-film fabrication. Scholar, Pennsylvania State University, University Park, 1996-1998.

Background

  • Fujiwara, Hiroyuki was born on September 25, 1968 in Asagaya, Tokyo, Japan.

  • Education

    • Doctor of Engineering, Tokyo Institute of Technology.

    Career

    • Research associate Electrotech. Laboratory, Tsukuba, Japan, 1998—2001, National Institute Advanced Industrial Science and Technology, since 2001.

    Major achievements

    • Achievements include research in Developments of real-time spectroscopic ellipsometry and infrared attenuated total reflection spectroscopy for monitoring semiconductor thin-film fabrication.
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    Born September 25, 1968
    (age 48)
    Nationality
    Ethnicity:
    • 1998 - 2001
      Research associate, Electrotech. Laboratory
      Tsukuba, Ibaraki, Japan

    Award