Background
Aker, David was born on July 4, 1951 in Brooklyn, New York, United States.
Aker, David was born on July 4, 1951 in Brooklyn, New York, United States.
Cooper Union (Bachelor of Science, 1973). State University of New York at Stony Brook (Master of Science, 1975). Saint John"s University School of Law (Juris Doctor, 1981).
Admitted to the bar, 1982, New New York 1984, United States. District Court, Eastern District of New New York 1985, United States. District Court, Southern District of New New York
Registered to practice before United States.
Patent and Trademark Office (Not admitted Connecticut). Sigma Pi Sigma. Adjunct Professor of Law, Touro College, Jacob Doctorate. Fuchsberg Law Center, Huntington, New York, 1983.
With: International Business Machines Corporation Corporation, 1990-1996. Gottlieb, Rackman & Reisman, Professional Corporation, New York, New York, 1987-1990.
(Chief Patent Counsel, Analytical Instruments).
Member: American Bar Association.