Eileen M. Ebel

Background

Ebel, Eileen M. was born on June 6, 1963 in Queens, New York, United States.

Education

Manhattan College (Bachelor of Science, 1985). Franklin Pierce Law Center (Juris Doctor, 1992).

Career

Worked at Felfe & Lynch (New York, New York) specializing in Patents, Trademarks. Admitted to the bar, 1993, New York, Registered to Practice before United States. Patent and Trademark Office.

Sigma Xi.

Delta Phi Alpha. Alpha Mu Gamma. Intern, Honorary Chief Judge Nies, United States. Court of Appeals, Federal Circuit, 1992.

Member: American Intellectual Property Law Association.

Achievements

• Eileen M. Ebel has been listed as a reputable lawyer by Martindale-Hubbell.

Membership

Member: American Intellectual Property Law Association.