Hiroyuki Fujiwara, Japanese research scientist. Achievements include research in Developments of real-time spectroscopic ellipsometry and infrared attenuated total reflection spectroscopy for monitoring semiconductor thin-film fabrication. Scholar, Pennsylvania State University, University Park, 1996-1998.
Fujiwara, Hiroyuki was born on September 25, 1968 in Asagaya, Tokyo, Japan.
Doctor of Engineering, Tokyo Institute of Technology.
Research associate Electrotech. Laboratory, Tsukuba, Japan, 1998—2001, National Institute Advanced Industrial Science and Technology, since 2001.