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Hiroyuki Fujiwara

research scientist

Hiroyuki Fujiwara, Japanese research scientist. Achievements include research in Developments of real-time spectroscopic ellipsometry and infrared attenuated total reflection spectroscopy for monitoring semiconductor thin-film fabrication. Scholar, Pennsylvania State University, University Park, 1996-1998.

Background

Fujiwara, Hiroyuki was born on September 25, 1968 in Asagaya, Tokyo, Japan.

Education

Doctor of Engineering, Tokyo Institute of Technology.

Career

Research associate Electrotech. Laboratory, Tsukuba, Japan, 1998—2001, National Institute Advanced Industrial Science and Technology, since 2001.

Achievements

  • Achievements include research in Developments of real-time spectroscopic ellipsometry and infrared attenuated total reflection spectroscopy for monitoring semiconductor thin-film fabrication.