Background
Rochester, JAMES was born on March 3, 1947 in Rochester, New York, United States.
Rochester, JAMES was born on March 3, 1947 in Rochester, New York, United States.
Rensselaer Polytechnic Institute (Bachelor of Science, cum laude, 1973). Georgetown University (Juris Doctor, 1977). Tau Beta Pi; Alpha Sigma Museum
Symposium Editor, American Criminal Law Review (American Bar Association), 1976-1977.
Working as a partner of FOLEY & LARDNER. Admitted to the bar, 1977, Virginia. 1979, Ohio; 1987, Wisconsin. Registered to practice before United States.
Patent and Trademark Office.
American Intellectual Property Law Association. Licensing Executives Society. Intellectual Property and Alternative Dispute Resolution Law.