Background
Beyer, James E. was born on September 5, 1967 in Cleveland, Ohio, United States.
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James E. Beyer
Edit ProfileEducation
University of Cincinnati (Bachelor of Science, 1990). American University (Juris Doctor, 1995).
Career
Worked at Killworth, Gottman, Hagan & Schaeff, Limited liability partnership (Dayton, Ohio) specializing in Patent, Trademark, Copyright and Unfair Competition Law. Admitted to the bar, 1995, Ohio and United States. District Court, Southern District of Ohio.
Registered to practice before the United States.
Patent and Trademark Office. Company-Author: "A Course in Evidence Foreign Patent Examiners," United States.
Patent and Trademark Office, 1994. Member: Dayton and American Bar Associations.
American Intellectual Property Lawyers Association (AIPLA, 1994).
The firm"s attorneys have outstanding academic backgrounds which have been enhanced through many years of practice in all substantive areas of intellectual property. This has been recognized by the law schools of both The Ohio State University and the University of Dayton, where the intellectual property law courses are taught by partners of the firm. Additionally, Richard Killworth, Tim Hagan and Jim Gottman are members of the faculty of the Patent Resources Group, an organization which provides continuing legal education courses for patent attorneys nationally.
Achievements
Membership
Member: Dayton and American Bar Associations. American Intellectual Property Lawyers Association (AIPLA, 1994).
