Background
Hamill, James J. was born on February 1, 1933 in Cuba City, Wisconsin, United States.
Hamill, James J. was born on February 1, 1933 in Cuba City, Wisconsin, United States.
Georgia Institute of Technology (Bachelor of Science in Biomedical Engineering, 1957). George Washington University (Bachelor of Laws, 1960). Pi Tau Sigma; Phi Alpha Delta.
Worked at Fitch, Even, Tabin & Flannery (Chicago, Illinois) specializing in Intellectual Property and Technology-Related Law including Patents, Trademarks, Trade Secret, Copyrights and Unfair Competition, Antitrust and International Trade Commission Causes and Related Litigation. Admitted to the bar, 1961, Illinois. Registered to practice before United States.
Patent and Trademark Office.
Pi Tau Sigma; Phi Alpha Delta. Member: Chicago and Illinois State Bar Associations.
Intellectual Property Law Association of Chicago. Fitch, Even, Tabin & Flannery was founded in 1859 as Goodwin, Larned & Goodwin making it the senior established law firm in Chicago.
Its practice is devoted to intellectual property and technology related law.
The firm"s clients range from independent inventors to multi-national corporations. The firm regularly represents its clients in courts and governmental agencies in the United States. as well as some 140 other countries. Firm members have been leaders in their respective fields of technology as well as in the legal community, having served as expert witnesses, special masters in the Federal Courts, educators, authors and also founders and presidents of noteworthy legal associations including the Intellectual Property Law Association of Chicago and its predecessor.
Member: Chicago and Illinois State Bar Associations. Intellectual Property Law Association of Chicago.
