Background
Muraff, James P. was born on July 4, 1967 in Chicago, Illinois, United States.
Muraff, James P. was born on July 4, 1967 in Chicago, Illinois, United States.
University of Illinois (Bachelor of Science, Computer Engineering, 1990). John Marshall Law School (Juris Doctor, 1994).
Worked at Wallenstein & Wagner, Limited. Admitted to the bar, 1994, Illinois and United States. District Court, Northern District of Illinois.
Registered to practice before the United States.
Patent and Trademark Office. Phi Delta Phi; Eta Kappa Nu.
Zeta Beta Tau. Editor, John Marshall Law Review.
Author, Issue Preclusion, "Recognizing Foreign Judgement in United States Patent Infringement Suits: A New Approach," 26 J. Marshall L. Review 627 (1993). Member: Chicago and Federal Bar Associations.
Intellectual Property Law Association of Chicago.
Member: Chicago and Federal Bar Associations. Intellectual Property Law Association of Chicago.