Background
Measures, Jeffrey M. was born on April 27, 1965 in Toronto, Ontario.
Measures, Jeffrey M. was born on April 27, 1965 in Toronto, Ontario.
University of Toronto (Bachelor of Applied Science, in Industrial Engineering, 1988). Osgoode Hall Law School (Bachelor of Laws, 1991).
Admitted to the bar, 1993, Ontario. 1994, registered Patent Agent Canada. Member: Law Society of Upper Canada.
Patent and Trademark Institute of Canada.
Member: Law Society of Upper Canada. Patent and Trademark Institute of Canada.