Background
Stover, John Clyde was born on June 26, 1942 in Madison, Wisconsin, United States. Son of John Ford and Marjorie Ellen (Filley) Stover.
- Photos
- Works
- Photos
- Works
book
Optical Scattering: Measurement and Analysis (Optical and Electro-Optical Engineering Series)
(As the authoritative resource on optical scattering, this...)
As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable. Contents: - Introduction to Light Scatter - Surface Roughness - Scatter Calculations and Diffraction Theory - Calculation of Smooth-Surface Statistics from the BRDF - Polarization of Scattered Light - Scatter Measurements and Instrumentation - Scatter Predictions - Detection of Discrete Surface and Subsurface Defects - Industrial Applications - Scatter Specifications - Review of Electromagnetic Wave Propogation - Kirchhoff Diffraction from Sinusoidal Gratings
http://www.amazon.com/gp/product/0070618143/?tag=2022091-20
Optical Scattering: Measurement and Analysis (Optical and Electro-Optical Engineering Series) by John C. Stover (1990-08-03)
http://www.amazon.com/gp/product/B01FJ16U8A/?tag=2022091-20
Optical Scattering: Measurement and Analysis (SPIE Press Monograph Vol. PM24) (Press Monographs)
(As the authoritative resource on optical scattering, this...)
As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable. Contents: - Introduction to Light Scatter - Surface Roughness - Scatter Calculations and Diffraction Theory - Calculation of Smooth-Surface Statistics from the BRDF - Polarization of Scattered Light - Scatter Measurements and Instrumentation - Scatter Predictions - Detection of Discrete Surface and Subsurface Defects - Industrial Applications - Scatter Specifications - Review of Electromagnetic Wave Propogation - Kirchhoff Diffraction from Sinusoidal Gratings
http://www.amazon.com/gp/product/0819419346/?tag=2022091-20
John Clyde Stover
Edit Profileconsultant instrumentation company executive
John Clyde Stover, American Instrumentation company executive, consultant. Board of directors Montana Business Connections, Missoula, since 1993. Member American Society for Testing and Materials (chairman subcommittee), Society Photo-Optical Instrumentation Engineers (editor procs. Optical Scattering 1989, 91, 93).
Education
Bachelor of Science in Electrical Engineering, Purdue University, 1964; Master of Science in Electrical Engineering, Purdue University, 1965; PhDEE, Purdue University, 1970.
Career
Graduate teaching and research assistant electrical engineering department, Purdue University, West Lafayette, Indiana, 1965-1969; research engineer, Dow Chemical Company, Golden, Colorado, 1969-1975; senior engineer, Rockwell International, Golden, 1975-1979; visiting lecturer electrical engineering Department, University Colorado, Boulder, 1980-1981; associate professor, Montana State University, Bozeman, 1981-1986; vice president engineering, Turnaround Management Association Technologies Inc., Bozeman, 1985-1991; president, chief technical officer, Turnaround Management Association Technologies Inc., Bozeman, 1992-1995; also board directors, Turnaround Management Association Technologies Inc., Bozeman president, Scatter Works Inc., since 1995; director research, ADE Optical Sys., Charlotte, North Carolina, since 1995. Member task force on particles SEMATECH, Austin, Texas, since 1993.
Achievements
Works
book
-
Optical Scattering: Measurement and Analysis (Optical and Electro-Optical Engineering Series)
(As the authoritative resource on optical scattering, this...)
-
Optical Scattering: Measurement and Analysis (SPIE Press Monograph Vol. PM24) (Press Monographs)
(As the authoritative resource on optical scattering, this...)
- Optical Scattering: Measurement and Analysis (Optical and Electro-Optical Engineering Series) by John C. Stover (1990-08-03)
-
Optical Scattering: Measurement and Analysis (Optical and Electro-Optical Engineering Series)
Membership
Board of directors Montana Business Connections, Missoula, since 1993. Member American Society for Testing and Materials (chairman subcommittee), Society Photo-Optical Instrumentation Engineers (editor procs. Optical Scattering 1989, 91, 93).
Interests
Connections
Married Donna Ann Wiederecht, July 30, 1978. Children: Sean, Shelly, Rhys, Margaux.
