Background
Samples, Kenneth H. was born on June 21, 1946 in Aurora, Nebraska, United States.
Samples, Kenneth H. was born on June 21, 1946 in Aurora, Nebraska, United States.
University of Nebraska (Bachelor of Science in Electrical Engineering, 1969). John Marshall Law School (Juris Doctor, with honors, 1973). Sigma Tau; Eta Kappa Nu.
Pi Mu Epsilon.
Worked at Fitch, Even, Tabin & Flannery (Chicago, Illinois) specializing in Intellectual Property and Technology-Related Law including Patents, Trademarks, Trade Secret, Copyrights and Unfair Competition, Antitrust and International Trade Commission Causes and Related Litigation. Admitted to the bar, 1973, Illinois and United States. District Court, Northern District of Illinois.
1982, United States.
Court of Appeals for the Federal Circuit. Registered to practice before United States. Patent and Trademark Office.
Sigma Tau.
Eta Kappa Nu. Pi Mu Epsilon. Member: American Intellectual Property Law Association. Intellectual Property Law Association of Chicago.
International Association for the Protection of Industrial Property.
Fitch, Even, Tabin & Flannery was founded in 1859 as Goodwin, Larned & Goodwin making it the senior established law firm in Chicago. Its practice is devoted to intellectual property and technology related law.
The firm"s clients range from independent inventors to multi-national corporations. The firm regularly represents its clients in courts and governmental agencies in the United States. as well as some 140 other countries.
Firm members have been leaders in their respective fields of technology as well as in the legal community, having served as expert witnesses, special masters in the Federal Courts, educators, authors and also founders and presidents of noteworthy legal associations including the Intellectual Property Law Association of Chicago and its predecessor.
Member: American Intellectual Property Law Association. Intellectual Property Law Association of Chicago. International Association for the Protection of Industrial Property.