Background
Maissel, Leon Israel was born on May 31, 1930 in Cape Town, South Africa. Son of Charles and Emily (Cohen) Maissel. came to the United States, 1956.
(A method is described for determining the refractive inde...)
A method is described for determining the refractive index and thickness of thin films using data from single-angle measurements of the intensity of linearly polarized light reflected from a growing film.
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Maissel, Leon Israel was born on May 31, 1930 in Cape Town, South Africa. Son of Charles and Emily (Cohen) Maissel. came to the United States, 1956.
Bachelor of Science, University Cape Town, 1949. Master of Science, University Cape Town, 1951. Doctor of Philosophy, University London, 1955.
Staff scientist, Philco Corporation, Philadelphia, 1956-1960; advisory physicist, International Business Machines Corporation Corporation, Poughkeepsie, New York, 1960-1963; senior engineer, International Business Machines Corporation Corporation, Poughkeepsie, New York, 1963-1981; senior technical staff member, International Business Machines Corporation Corporation, Poughkeepsie, New York, 1981-1993; patent writer, since 1994.
(A method is described for determining the refractive inde...)
Fellow Institute of Electrical and Electronics Engineers. Member American Vacuum Society (Director 1966-1968) Lodges: B'nai B'rith.
Married Raina Eve Corren, January 26, 1956. Children: Simon, Gerda, Joseph.