Michael J. Eltze, American electrical engineer. Achievements include research in the reliability and CHC lifetimes of various submicron pate oxide materials and effective reliability screening methods for probes. Member Institute of Electrical and Electronics Engineers, Tau Beta Pi, Eta Kappa Nu.
Eltze, Michael J. was born on January 24, 1966 in Ames, Iowa, United States.
Bachelor of Science in Electrical Engineering, Kansas State University, 1989. Master of Science in Electrical Engineering, University Texas, El Paso, 1997.