Background
Gilman, Michael R. was born on April 25, 1962 in Mount Vernon, New York, United States.
Gilman, Michael R. was born on April 25, 1962 in Mount Vernon, New York, United States.
Rutgers School of Engineering (Bachelor of Science, Civil Engineering, 1985). Fordham University (Juris Doctor, 1989).
Worked at Gottlieb, Rackman & Reisman, Professional Corporation (New York, New York) specializing in Patent, Trademark, Copyright and Unfair Competition Law. Admitted to the bar, 1989, Connecticut. 1990, New York and United States.
District Court, Southern and Eastern Districts of New New York
1991, registered to practice before United States. Patent and Trademark Office.
Tau Beta Pi. Chi Epsilon. Trade Show Speaker, Copyright, Trademark and Patent Fundamentals.
Member: New York State and American (Section on Patent, Trademark and Copyright Law) Bar Association.
Founded in 1970, Gottlieb, Rackman & Reisman is a firm of patent, trademark and copyright attorneys qualified to practice in all areas of intellectual property law, including appearing before the United States Patent and Trademark Office, the United States Copyright Office and all federal courts throughout the country. The firm specializes in counseling in intellectual property matters, including litigation, in the United States and foreign countries. The firm"s philosophy is to encourage one-to-one client-attorney relationships, based on the attorneys" ability to deal with sophisticated technology and related commercial issues, allowing the firm to effectively counsel clients on a broad range of matters.
Member: New York State and American (Section on Patent, Trademark and Copyright Law) Bar Association.