Background
Jha, Niraj K. was born on January 10, 1960 in India.
(Device testing represents the single largest manufacturin...)
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
http://www.amazon.com/gp/product/0521773563/?tag=2022091-20
Jha, Niraj K. was born on January 10, 1960 in India.
Bachelor of Technology, Indian Institute of Technology, Kharagpur, 1981. Master of Science, State University of New York, StonyBrook, 1982. Doctor of Philosophy, University Illinois, Urbana-Champaign, 1985.
Assistant professor University Michigan, Ann Arbor, 1985—1987. Professor Princeton University, New Jersey, since 1987.
(Device testing represents the single largest manufacturin...)