Background
Henon, Paul J. was born on March 13, 1933 in Atlantic City, New Jersey, United States.
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Paul J. Henon
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PAUL HENON, American Lawyer, Partner of NIXON & VANDERHYE Professional Corporation, specializing in the field of United States and International Patent. Trademark. Copyright and Unfair Competition Law, Other Matters Involving Technology and Related Litigation in all Courts and Administrative Agencies Including the United States. International Trade Commission.
Education
Georgia Institute of Technology (Bachelor of Science in Electrical Engineering, 1960). American University (Juris Doctor, 1967). Lecturer, Patent Law, George Washington University, 1972-1982.
Examiner-In-Chief, Board of Patent Appeals and Interferences, 1974-1989.
Examiner, Senior Examiner, Supervisory Examiner for data processing systems and sub-systems, United States. Patent and Trademark Office, 1961-1974.
Acting MembeF. Board of Patent Interferences, since 1968.
Career
Worked at Nixon & Vanderhye, Professional Corporation Admitted to the bar, 1967, District of Columbia. 1994, Virginia; registered to practice before United States.
Patent and Trademark Office. Lecturer, Patent Law, George Washington University, 1972-1982.
Examiner-In-Chief, Board of Patent Appeals and Interferences, 1974-1989.
Examiner, Senior Examiner, Supervisory Examiner for data processing systems and sub-systems, United States. Patent and Trademark Office, 1961-1974. Acting Member, Board of Patent Interferences, 1968.
Member: The District of Columbia Bar.
Virginia State Bar; Patent and Trademark Office Society.
Achievements
Membership
Member: The District of Columbia Bar. Virginia State Bar; Patent and Trademark Office Society.
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Born
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Nationality
American
Education
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1967