Background
Ammerlaan, Cornelis A.J. was born on June 12, 1934 in Amsterdam. Son of Johannes F.J. and Antoinetta Michael Jackson (Van Ginneken) Ammerlaan.
(This volume reviews recent developments in the materials ...)
This volume reviews recent developments in the materials science of silicon. The topics discussed range from the fundamental characterization of the physical properties to the assessment of materials for device applications, and include: crystal growth; process-induced defects; topography; hydrogenation of silicon; impurities; and complexes and interactions between impurities. In view of its key position within the conference scope, several papers examine process induced defects: defects due to ion implantation, silicidation and dry etching, with emphasis being placed on the device aspects. Special attention is also paid to recent developments in characterization techniques on epitaxially grown silicon, and silicon-on-insulators.
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Ammerlaan, Cornelis A.J. was born on June 12, 1934 in Amsterdam. Son of Johannes F.J. and Antoinetta Michael Jackson (Van Ginneken) Ammerlaan.
Doctor of Science in Physics, University Amsterdam, 1967.
Professor physics University Amsterdam, since 1990. Member European Organization of Nuclear Research/ISOLDE Science Council, Geneva, since 1995.
(Covers two important branches of materials science: semic...)
(This volume reviews recent developments in the materials ...)
Lieutenant Royal Dutch Air Force, 1958-1960. Member Dutch Physical Society, European Physical Society, European Materials Research Society.
Married Catharina W. Beuken, September 2, 1961.