Background
Tarnoff, David L. was born on October 18, 1960 in Newark, New Jersey, United States.
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David L. Tarnoff
Edit ProfileEducation
Cornell University (Bachelor of Science, 1982). Catholic University of America (Juris Doctor, 1988).
Career
Worked at Roylance, Abrams, Berdo & Goodman, L.L.P. (Washington, DC) specializing in Patent, Trademark, Copyright and Unfair Competition Law. International Patent and Trademark Practice. Litigation in all Federal Courts.
Admitted to the bar, 1988, Virginia. 1994, District of Columbia. Registered to practice before United States.
Patent and Trademark Office. Patent Examiner, United States. Patent and Trademark Office, 1982-1986.
Member: The District of Columbia Bar. Virginia State Bar; American Bar Association (Member, Patent, Trademark and Copyright Section). American Intellectual Property Law Association.
Founded in 1954, the firm is dedicated to providing quality legal services across the full range of intellectual property law in the United States and worldwide. The firm advises on the protection, enforcement, and licensing of intellectual property rights including inventions, designs, trademarks, trade secrets and artistic works. The firm has extensive experience, skill and expertise in litigation in the federal courts, as well as negotiation and settlement of inter parties controversies and drafting and negotiating of licenses.
In prosecution of patents, trademarks and copyrights and inter party matters before the United States. Patent and Trademark Office and the United States. Copyright Office, as well as the corresponding offices abroad.
And in all major technologies.
Membership
Member: The District of Columbia Bar. Virginia State Bar; American Bar Association (Member, Patent, Trademark and Copyright Section). American Intellectual Property Law Association.
