Background
Muirhead, Donald W. was born on May 15, 1959 in Passaic, New Jersey, United States.
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Donald W. Muirhead
Edit ProfileEducation
Lafayette College (Bachelor of Science in Electrical Engineering, 1982). Rensselaer Polytechnic Institute (M.S.C.S., 1984). University of Connecticut (Juris Doctor, 1989).
Career
Worked at Foley, Hoag & Eliot Limited Liability Partnership (Boston, Master of Arts) specializing in Patent Law, Intellectual Property Law. Admitted to the bar, 1989, Connecticut. 1992, United States. Court of Appeals for the Federal Circuit.
1993, Virginia.
1996, Massachusetts. Registered to practice before United States. Patent and Trademark Office.
Recipient: American Jurisprudence Award, Criminal Law, Property. Aaron Nassau Award.
Achievements
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Born
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Nationality
American