Background

Siegel, Jeffrey David was born on April 17, 1957 in Oakland, California, United States. Son of William Leo and Marilyn Jean Siegel.

Education

Student, Contra Costa College, Richmond, California, 1974, 77.

Career

Non destructive examination technician, engineering assistant, Conam Inspection, Richmond, California, 1977-1980; applications specialist, supervisor, product development manager, Zetec Inc., Issaquah, Washington, since 1981.

Achievements

• Jeffrey David Siegel has been listed as a noteworthy development executive, specialist by Marquis Who's Who.

Membership

Member American Society Nondestructive Testing (northwest region).

Connections

Father:

William Leo

Mother:

Marilyn Jean Siegel