Background
Angwin, Jeffrey Robert was born on April 3, 1955 in Palo Alto, California, United States. Son of Robert Raymond and Pamela Louise (Nickerson) Angwin.
Angwin, Jeffrey Robert was born on April 3, 1955 in Palo Alto, California, United States. Son of Robert Raymond and Pamela Louise (Nickerson) Angwin.
Bachelor of Science in Electrical Engineering, Stanford University, 1977.
Project engineer, Telesensory Systems Company, Palo Alto, 1974-1980; design engineer, Fairchild Test Systems, Billerica, Massachusetts, 1980-1982; product engineer, National Semiconductor Corporation, Santa Clara, California, 1982-1983; senior applications engineer, Test division Marconi Instruments, Sunnyvale, California, 1983; engineering manager, Automatic Test division Marconi Instruments, Sunnyvale, California, 1983-1987; senior applications engineer, Valid Logic Systems, Inc., San Jose, California, 1987-1992; senior engineer, Cadence Design Systems, San Jose, California, since 1992.
Member Institute of Electrical and Electronics Engineers, American Society Test Engineers.