Background
Butler, Kenneth Michael was born on November 23, 1962 in Tulsa. Son of John Michael and Dora Maria (Gomez) Butler.
(For many years, the dominant fault model in automatic tes...)
For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.
http://www.amazon.com/gp/product/146136602X/?tag=2022091-20
(For many years, the dominant fault model in automatic tes...)
For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.
http://www.amazon.com/gp/product/0792392221/?tag=2022091-20
Butler, Kenneth Michael was born on November 23, 1962 in Tulsa. Son of John Michael and Dora Maria (Gomez) Butler.
Bachelor of Science in Electrical Engineering, Oklahoma State University, 1985. Microsoft Security Essentials, University Texas, 1987. Doctor of Philosophy, University Texas, 1990.
Software developer, Corps of Engineering, Tulsa, 1983; software developer, Texas Instruments, Sherman, 1984; software and hardware developer, Texas Instruments, Dallas, 1985, 86; senior member, technical staff, Texas Instruments, Dallas, since 1991; laboratory instructor, Oklahoma State University, Stillwater, 1985-1986; research assistant, Oklahoma State University, Stillwater, 1986; research assistant, University Texas, Austin, 1986-1990. Speaker in field; member test methods project technical advisory board Sematech, Austin, since 1994, member DFT project technical advisory board, since 1995.
(For many years, the dominant fault model in automatic tes...)
(For many years, the dominant fault model in automatic tes...)
(Softcover reprint of)
Fellow Institute of Electrical and Electronics Engineers. Member Association Computing Machinery, Eta Kappa Nu.
Married Stephanie Ann Watts, May 17, 1986.